Optimizing the setting of an electron microscope for highest resolution using statistical parameter estimation theory

TitleOptimizing the setting of an electron microscope for highest resolution using statistical parameter estimation theory
Publication TypeConference Paper
Year of Publication1998
Authorsden Dekker, A J., J. Sijbers, and D. Van Dyck
Conference NameWorkshop: Towards Atomic Resolution Analysis 98
Date PublishedSeptember
Conference LocationPort Ludlow, WA, U.S.A