StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images

TitleStatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
Publication TypeJournal Article
Year of Publication2016
AuthorsDe Backer, A., K. H. W. van den Bos, W. Van den Broek, J. Sijbers, and S. Van Aert
JournalUltramicroscopy
Volume171
Pagination104–116
DOI10.1016/j.ultramic.2016.08.018