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Upscaling of spectroradiometer data for stress detection in orchards with remote sensing
Publication Type:
Conference Paper
Authors:
Pieter Kempeneers
;
Steve De Backer
;
Stephanie Delalieux
;
S Sterckx
;
W. Debruyn
;
P. Coppin
;
Paul Scheunders
Source:
SPIE Remote Sensing, Gran Canaria, 13-16 september, SPIE, Volume 127, Maspalomas, Spain, p.37-45 (2004)
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