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2023
M. Yosifov, Weinberger, P., Reiter, M., Fröhler, B., De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Defect detectability analysis via Probability of defect detection between traditional and deep learning methods in numerical simulations”, in e-Journal of Nondestructive Testing, 2023, vol. 28, no. 3.PDF icon Download paper (2.37 MB)