Publications

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2019
Fatermans, J., A J. den Dekker, C. M. O'Leary, P. D. Nellist, and S. Van Aert, "Atom column detection from STEM images using the maximum a posteriori probability rule", MC 2019, Berlin, Germany, 2019.
Fatermans, J., A J. den Dekker, and S. Van Aert, "Atom detection from electron microscopy images", RBSM 2019, Louvain-la-Neuve, Belgium, 2019.
Presenti, A., J. Sijbers, A J. den Dekker, and J. De Beenhouwer, "CAD-based defect inspection with optimal view angle selection based on polychromatic X-ray projection images", 9th Conference on Industrial Computed Tomography, Padova, Italy, 2019. PDF icon Download paper (219.28 KB)
Buikema, A. E., A J. den Dekker, and J. Sijbers, "Effect of diffusion time dependence on parameter estimation in the clinical time frame: a simulation study using PGSE", 11th Annual Meeting of the ISMRM Benelux Chapter, Leiden, the Netherlands, 2019.
Fatermans, J., S. Van Aert, and A J. den Dekker, "The maximum a posteriori probability rule for atom column detection from HAADF STEM images", Ultramicroscopy, vol. 201, pp. 81-91, 2019.
Van Aert, S., A. De wael, J. Fatermans, I. Lobato, A. De Backer, L. Jones, A J. den Dekker, and P. D. Nellist, "Quantifying 3D atomic structures of nanomaterials and their dynamics using model-based scanning transmission electron microscopy", Spring Meeting of the EMRS, Nice, France, 2019.
Van Aert, S., A. De wael, J. Fatermans, I. Lobato, A. De Backer, L. Jones, A J. den Dekker, and P. D. Nellist, "Strategies for quantifying 3D atomic structures of nanomaterials and their dynamics using dose-efficient ADF STEM", PICO2019, Vaalsbroek, The Netherlands, 2019.
2018
Ramos-Llordén, G., Q. Beirinckx, A J. den Dekker, and J. Sijbers, "Accurate and precise MRI relaxometry: the often disregarded but critical role of statistical parameter estimation", 26th Annual Meeting of the ISMRM, Paris, France, 2018.
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert, "Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection", SCANDEM 2018, Technical University of Denmark, Kgs. Lyngby, Denmark, 2018.
Collier, Q., J. Veraart, B. Jeurissen, F. Vanhevel, P. Pullens, P. M. Parizel, A J. den Dekker, and J. Sijbers, "Diffusion kurtosis imaging with free water elimination: a Bayesian estimation approach", Magnetic Resonance in Medicine, vol. 80, issue 2, pp. 802-813, 2018. PDF icon Download paper (1.93 MB)
Ramos-Llordén, G., Q. Beirinckx, A J. den Dekker, and J. Sijbers, "An educational presentation on accurate and precise MRI relaxometry: the often disregarded but critical role of statistical parameter estimation", 10th Annual Meeting of the ISMRM Benelux Chapter, Antwerp, Belgium, 2018.
Ramos-Llordén, G., "Improved MRI Relaxometry through Statistical Signal Processing", Dept. of Physics , vol. Doctor of Science, Antwerp, University of Antwerp, 02/2018. PDF icon Download thesis (19.25 MB)
Van Aert, S., J. Fatermans, A. De Backer, K.. H. W. van den Bos, C. M. O'Leary, K. Müller-Caspary, L. Jones, I. Lobato, A. Béché, A J. den Dekker, et al., "Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials", IMC19, Sydney, Australia, 2018.
Fatermans, J., A J. den Dekker, K. Müller-Caspary, I. Lobato, and S. Van Aert, "The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images", IMC19, Sydney, Australia, 2018.
Ramos-Llordén, G., G. Vegas-Sánchez-Ferrero, M. Björk, F. Vanhevel, P. M. Parizel, R. San José Estépar, A J. den Dekker, and J. Sijbers, "NOVIFAST: A fast algorithm for accurate and precise VFA MRI T1 mapping", IEEE Transactions on Medical Imaging, vol. 37, issue 11, pp. 2414 - 2427, 2018. PDF icon Download paper (3.3 MB)
Elberfeld, T., J. De Beenhouwer, A J. den Dekker, C. Heinzl, and J. Sijbers, "Parametric Reconstruction of Advanced Glass Fiber-reinforced Polymer Composites from X-ray Images", 8th Conference on Industrial Computed Tomography, Wels, Austria, 2018. PDF icon Download paper (636.09 KB)
Elberfeld, T., J. De Beenhouwer, A J. den Dekker, C. Heinzl, and J. Sijbers, "Parametric Reconstruction of Glass Fiber-reinforced Polymer Composites from X-ray Projection Data - A Simulation Study", Journal of Nondestructive Evaluation, vol. 37, issue 62, pp. 1573-4862, Jul, 2018.
Buikema, A. E., A J. den Dekker, and J. Sijbers, "Simultaneous T2/diffusion estimation: do we need a diffusion time dependent diffusion model?", 10th Annual Meeting of the ISMRM Benelux Chapter, Antwerp, Belgium, 2018.
Fatermans, J., A J. den Dekker, K.. Müller-Caspary, I. Lobato, C.. M. O'Leary, P. D. Nellist, and S. Van Aert, "Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images", Phys. Rev. Lett., vol. 121, pp. 056101, Jul, 2018.

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