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E. Bettens, den Dekker, A. J., Sijbers, J., and Van Dyck, D., Ultimate resolution in the framework of parameter estimation, in IASTED International Conference - Signal and Image Processing (SIP'98), Las Vegas, Nevada, USA, 1998, pp. 229-233.PDF icon Download paper (113.28 KB)
D. Van Dyck, Bettens, E., Sijbers, J., Op de Beeck, M., den Dekker, A. J., and van den Bos, A., From High Resolution Image to Atomic Structure: how fare are we?, Scanning Microscopy, Special Issue on Image Processing, vol. 11, pp. 467-478, 1997.
A. J. den Dekker and van den Bos, A., Resolution: a survey, J. Opt. Soc. Am. A, vol. 14, pp. 547–557, 1997.
D. Van Dyck, Bettens, E., Sijbers, J., den Dekker, A. J., van den Bos, A., Op de Beeck, M., Jansen, J., and Zandbergen, H., Resolving atoms: what do we have? what do we want?, in Institute of Physics Conference Series, vol. 153, J. M. Rodenburg, Ed. Cambridge, UK: Institute of Physics Ltd, 1997, pp. 95-100.
J. Sijbers, den Dekker, A. J., Scheunders, P., Raman, E., and Van Dyck, D., Unbiased signal estimation in magnitude MR images, in Proceedings of the European Society for Magnetic Resonance in Medicine and Biology, Brussels, Belgium, 1997, vol. 2, p. 174.