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2021
D. Iuso, Nazemi, E., Six, N., De Samber, B., De Beenhouwer, J., and Sijbers, J., “CAD-based scatter compensation for polychromatic reconstruction of additive manufactured parts”, in IEEE ICIP, 2021, pp. 2948-2952.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Eight - General conclusions and future perspectives”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Eight - General conclusions and future perspectives”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Four - Atom counting”, in Advances in Imaging and Electron Physics,, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Four - Atom counting”, in Advances in Imaging and Electron Physics,, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter One - Introduction”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter One - Introduction”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Six - Atom column detection”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
J. Fatermans, De Backer, A., den Dekker, A. J., and Van Aert, S., “Chapter Six - Atom column detection”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Three - Efficient fitting algorithm”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Three - Efficient fitting algorithm”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Two - Statistical parameter estimation theory: principles and simulation studies”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. De Backer, Fatermans, J., den Dekker, A. J., and Van Aert, S., “Chapter Two - Statistical parameter estimation theory: principles and simulation studies”, in Advances in Imaging and Electron Physics, vol. 217, Science Direct Elsevier, 2021.
A. Presenti, Liang, Z., Alves Pereira, L. F., Sijbers, J., and De Beenhouwer, J., “CNN-based Pose Estimation of Manufactured Objects During Inline X-ray Inspection”, in 2021 IEEE 6th International Forum on Research and Technology for Society and Industry (RTSI), 2021.
M. Nicastro, Jeurissen, B., Beirinckx, Q., Smekens, C., Poot, D. H. J., Sijbers, J., and den Dekker, A. J., “Comparison of MR acquisition strategies for super-resolution reconstruction using the Bayesian Mean Squared Error”, in International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, 2021.
J. Sanctorum, Sijbers, J., and De Beenhouwer, J., “Dark field sensitivity in single mask edge illumination lung imaging”, in 2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), Nice, France, 2021, pp. 775-778.
R. Paolella, de la Rosa, E., Sima, D. M., Dive, D., Durand-Dubief, F., Sappey-Marinier, D., Jeurissen, B., Sijbers, J., and Billiet, T., “Decoding Multiple Sclerosis EDSS disability scores from MRI using Deep Learning”, 38th Annual Scientific Meeting Congress of the European Society for Magnetic Resonance in Medicine and Biology, vol. 34. pp. S57-S58, 2021.
R. Paolella, de la Rosa, E., Sima, D. M., Dive, D., Durand-Dubief, F., Sappey-Marinier, D., Jeurissen, B., Sijbers, J., and Billiet, T., “Decoding Multiple Sclerosis EDSS disability scores from MRI using Deep Learning”, 38th Annual Scientific Meeting Congress of the European Society for Magnetic Resonance in Medicine and Biology, vol. 34. pp. S57-S58, 2021.
R. Paolella, de la Rosa, E., Sima, D. M., Dive, D., Durand-Dubief, F., Sappey-Marinier, D., Jeurissen, B., Sijbers, J., and Billiet, T., “Decoding Multiple Sclerosis EDSS disability scores from MRI using Deep Learning”, 38th Annual Scientific Meeting Congress of the European Society for Magnetic Resonance in Medicine and Biology, vol. 34. pp. S57-S58, 2021.
L. F. Alves Pereira, Van Nieuwenhove, V., De Beenhouwer, J., and Sijbers, J., “A Deep Convolutional Framelet Network based on Tight Steerable Wavelet: application to sparse-view medical tomosynthesis”, in International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, 2021.
A. Presenti, Sijbers, J., and De Beenhouwer, J., “Dynamic few-view X-ray imaging for inspection of CAD-based objects”, Expert Systems with Applications, vol. 180, p. 115012, 2021.

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