A bimodal energy model for correcting beam hardening artefacts in X-ray tomography

Publication Type:

Conference Paper

Authors:

Elke Van de Casteele; Dirk Van Dyck; Jan Sijbers; Erik Raman

Source:

IEEE 29th Annual Northeast Bioengineering Conference2003 IEEE 29th Annual Proceedings of Bioengineering Conference, IEEE, Newark, NJ, USA, p.57 - 58 (2003)