Publications

Export 28 results:
Author Type [ Year(Asc)]
Filters: Author is Elke Van de Casteele  [Clear All Filters]
2018
Van de Casteele, E., E. Perilli, W. Van Aarle, K. Reynolds, and J. Sijbers, "Discrete tomography in an in vivo small animal bone study", Journal of Bone and Mineral Metabolism, vol. 36, issue 1, pp. 40–53, 2018.
2017
Ouwendijk, M., N. Slingerland, J. van Nistelrooij, T. Huysmans, E. Van de Casteele, F. Van Glabbeek, G. Meermans, and F. Verstreken, "Screw fixation of simulated scaphoid waist fractures: a biomechanical comparison of two screw lengths.", European Federation of National Associatinos of Orthopaedics and Traumatology (EFORT), 18th ANNUAL CONGRESS, VIENNA, AUSTRIA, 2017.
2009
Gupta, C., E. Van de Casteele, and J. K. Chakravartty, "Imaging of voids due to deformation in alloy steel using micro-focus X-ray beam", Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 267, issue 20, pp. 3488 - 3490, 10/2009.
Boone, M. A., T. De Kock, J. Dewanckele, V. Cnudde, M. N. Boone, D. Van Loo, E. Van de Casteele, G. De Schutter, and P. Jacobs, "Three-dimensional monitoring of physical weathering in limestone with X-ray computed microtomography (micro-CT)", 12th Euroseminar on Microscopy Applied to Building Materials (EMABM), 2009.
2006
Batenburg, K. J., J. Sijbers, and E. Van de Casteele, "Automatic multiple threshold scheme for segmentation of tomograms", Proceedings of the Biomedical Engineering IEEE/EMBS Benelux Symposium, vol. 2, Brussels, Belgium, pp. 143-146, December, 2006.
Bugani, S., M. Camaiti, L. Morselli, K. Janssens, and E. Van de Casteele, "Investigation on Lecce stone porosity by means of micro and nano X-ray tomography", European conference on X-ray Spectrometry (EXRS), 2006.
2003
Van de Casteele, E., D. Van Dyck, J. Sijbers, and E. Raman, "A bimodal energy model for correcting beam hardening artefacts in X-ray tomography", IEEE 29th Annual Northeast Bioengineering Conference2003 IEEE 29th Annual Proceedings of Bioengineering Conference, Newark, NJ, USA, IEEE, pp. 57 - 58, 2003.

Pages