The effect of beam hardening on MTF measurements in X-ray microtomography

TitleThe effect of beam hardening on MTF measurements in X-ray microtomography
Publication TypeConference Paper
Year of Publication2004
AuthorsVan de Casteele, E., D. Van Dyck, J. Sijbers, and E. Raman
Conference Name19th Annual Symposium of the Belgian Hospital Physicists Association
Date PublishedJanuary