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Super-resolution for computed tomography based on discrete tomography
Publication Type:
Journal Article
Authors:
Wim Van Aarle
;
Kees Joost Batenburg
;
Gert Van Gompel
;
Elke Van de Casteele
;
Jan Sijbers
Source:
IEEE Transactions on Image Processing, Volume 23, Issue 3, p.1181 - 1193 (2014)
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Research area:
X-ray imaging
Tomography