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X-ray imaging
Edge illumination X-ray phase contrast imaging: Advancements in simulations and inline acquisitions
N. Francken
,
“
Edge illumination X-ray phase contrast imaging: Advancements in simulations and inline acquisitions
”
, 2025.
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Towards adaptive multi-resolution edge illumination X-ray phase contrast imaging
P. - J. Vanthienen
,
“
Towards adaptive multi-resolution edge illumination X-ray phase contrast imaging
”
, 2025.
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Ensuring Flawlessness in Additive Manufacturing: Advances in X-ray Inspection Techniques for Efficient Defect Detection
D. Iuso
,
“
Ensuring Flawlessness in Additive Manufacturing: Advances in X-ray Inspection Techniques for Efficient Defect Detection
”
, 2024.
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DAMMER: Direct Adaptive Multi-resolution MEsh Reconstruction from X-ray measurements
J. Merckx
,
den Dekker, A. J.
,
Sijbers, J.
, and
De Beenhouwer, J.
,
“
DAMMER: Direct Adaptive Multi-resolution MEsh Reconstruction from X-ray measurements
”
,
IEEE Transactions on Computational Imaging
, 2025.
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SwinIR-based Dual-Domain Reconstruction for Sparse-View Computed Tomography
J. Van der Rauwelaert
,
Bossuyt, C.
,
Verleden, S.
, and
Sijbers, J.
,
“
SwinIR-based Dual-Domain Reconstruction for Sparse-View Computed Tomography
”
,
Journal of Nondestructive Evaluation
, 2025.
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A PHASE‑CONTRAST X‑RAY IMAGING SYSTEM FOR OBTAINING A DARK‑FIELD IMAGE AND A METHOD THEREFOR
J. De Beenhouwer
and
Sijbers, J.
,
“
A PHASE‑CONTRAST X‑RAY IMAGING SYSTEM FOR OBTAINING A DARK‑FIELD IMAGE AND A METHOD THEREFOR
”
, U.S. Patent EP 4 351 425 B12025.
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Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation
P. - J. Vanthienen
,
Francken, N.
,
Sanctorum, J.
,
Sijbers, J.
, and
De Beenhouwer, J.
,
“
Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation
”
,
Optics Express
, vol. 33, no. 8, pp. 17886-17902, 2025.
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Correcting for focal spot drift in edge illumination X-ray phase contrast imaging
N. Francken
,
Sanctorum, J.
,
Huyge, B.
,
Sijbers, J.
, and
De Beenhouwer, J.
,
“
Correcting for focal spot drift in edge illumination X-ray phase contrast imaging
”
, in
14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium
, 2025.
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Single X-ray Projection Material Decomposition using a Mesh Projector
F. Linsen
,
Iuso, D.
, and
Sijbers, J.
,
“
Single X-ray Projection Material Decomposition using a Mesh Projector
”
, in
14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium (iCT 2025)
, 2025.
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Proximal Neural Networks based reconstruction for few-view CT applications
H. Le
,
Bossuyt, C.
,
Escoda, J.
,
Costin, M.
,
De Beenhouwer, J.
, and
Sijbers, J.
,
“
Proximal Neural Networks based reconstruction for few-view CT applications
”
, in
14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium
, 2025.
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