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X-ray imaging

Edge illumination X-ray phase contrast imaging: Advancements in simulations and inline acquisitions

N. Francken, “Edge illumination X-ray phase contrast imaging: Advancements in simulations and inline acquisitions”, 2025.

Towards adaptive multi-resolution edge illumination X-ray phase contrast imaging

P. - J. Vanthienen, “Towards adaptive multi-resolution edge illumination X-ray phase contrast imaging”, 2025.

Ensuring Flawlessness in Additive Manufacturing: Advances in X-ray Inspection Techniques for Efficient Defect Detection

D. Iuso, “Ensuring Flawlessness in Additive Manufacturing: Advances in X-ray Inspection Techniques for Efficient Defect Detection”, 2024.

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DAMMER: Direct Adaptive Multi-resolution MEsh Reconstruction from X-ray measurements

J. Merckx, den Dekker, A. J., Sijbers, J., and De Beenhouwer, J., “DAMMER: Direct Adaptive Multi-resolution MEsh Reconstruction from X-ray measurements”, IEEE Transactions on Computational Imaging , 2025.

SwinIR-based Dual-Domain Reconstruction for Sparse-View Computed Tomography

J. Van der Rauwelaert, Bossuyt, C., Verleden, S., and Sijbers, J., “SwinIR-based Dual-Domain Reconstruction for Sparse-View Computed Tomography”, Journal of Nondestructive Evaluation, 2025.

A PHASE‑CONTRAST X‑RAY IMAGING SYSTEM FOR OBTAINING A DARK‑FIELD IMAGE AND A METHOD THEREFOR

J. De Beenhouwer and Sijbers, J., “A PHASE‑CONTRAST X‑RAY IMAGING SYSTEM FOR OBTAINING A DARK‑FIELD IMAGE AND A METHOD THEREFOR”, U.S. Patent EP 4 351 425 B12025.

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Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation

P. - J. Vanthienen, Francken, N., Sanctorum, J., Sijbers, J., and De Beenhouwer, J., “Gratings for multiresolution edge illumination X-ray phase contrast imaging: concept and simulation”, Optics Express, vol. 33, no. 8, pp. 17886-17902, 2025.

Correcting for focal spot drift in edge illumination X-ray phase contrast imaging

N. Francken, Sanctorum, J., Huyge, B., Sijbers, J., and De Beenhouwer, J., “Correcting for focal spot drift in edge illumination X-ray phase contrast imaging”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.

Single X-ray Projection Material Decomposition using a Mesh Projector

F. Linsen, Iuso, D., and Sijbers, J., “Single X-ray Projection Material Decomposition using a Mesh Projector”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium (iCT 2025), 2025.

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Proximal Neural Networks based reconstruction for few-view CT applications

H. Le, Bossuyt, C., Escoda, J., Costin, M., De Beenhouwer, J., and Sijbers, J., “Proximal Neural Networks based reconstruction for few-view CT applications”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium, 2025.

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