Inline edge illumination through sample mask misalignment: a proof of concept

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Abstract:

Edge illumination (EI) is an X-ray phase contrast imaging setup that allows
measuring two additional complimentary contrasts. The setup consists of two absorbing
masks with slit shaped apertures. Typically, one of the masks is stepped during scans,
complicating the application of EI in inline settings. Current solutions exist, but require
either limiting the number of retrieved contrasts or fabricating specialized masks. In this
work, an EI scanning method with purposely misaligned conventional EI masks is
proposed to enable inline EI. Good agreement is found between conventional and inline EI
flatfield parameters, and first inline scan results are presented.

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20240415160406_47435.pdf