X-ray micro tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles

TitleX-ray micro tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles
Publication TypeJournal Article
Year of Publication2010
AuthorsPerfetti, G., E. Van de Casteele, B. Rieger, W. J. Wildeboer, and G. M. H. Meesters
JournalAdvanced Powder Technology
Volume21
Issue6
Pagination663 - 675
Date Published11/2010
ISSN09218831
DOI10.1016/j.apt.2010.08.002
Short TitleAdvanced Powder Technology