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A bimodal energy model for correcting beam hardening artefacts in X-ray tomography
Publication Type:
Conference Paper
Authors:
Elke Van de Casteele
;
Dirk Van Dyck
;
Jan Sijbers
;
Erik Raman
Source:
IEEE 29th Annual Northeast Bioengineering Conference2003 IEEE 29th Annual Proceedings of Bioengineering Conference, IEEE, Newark, NJ, USA, p.57 - 58 (2003)
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