A model-based correction method for beam hardening artefacts in X-ray microtomography

Publication Type:

Journal Article

Authors:

Elke Van de Casteele; Dirk Van Dyck; Jan Sijbers; Erik Raman

Source:

Journal of X-ray science and technology, Volume 12, Number 1, p.53-57 (2004)
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Research area: 
Tomography