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A model-based correction method for beam hardening artefacts in X-ray microtomography
Publication Type:
Journal Article
Authors:
Elke Van de Casteele
;
Dirk Van Dyck
;
Jan Sijbers
;
Erik Raman
Source:
Journal of X-ray science and technology, Volume 12, Number 1, p.53-57 (2004)
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Research area:
Tomography