A model-based correction method for beam hardening artefacts in X-ray microtomography

TitleA model-based correction method for beam hardening artefacts in X-ray microtomography
Publication TypeJournal Article
Year of Publication2004
AuthorsVan de Casteele, E., D. Van Dyck, J. Sijbers, and E. Raman
JournalJournal of X-ray science and technology
Volume12
Pagination53-57
Research area: