Effect of beam hardening on resolution in x-ray microtomography

Publication Type:

Conference Paper

Authors:

Elke Van de Casteele; Dirk Van Dyck; Jan Sijbers; Erik Raman

Source:

SPIE Medical Imaging: Image Processing, Volume 5370, San Diego CA, USA, p.2089-2096 (2004)
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Research area: 
Tomography