Effect of beam hardening on resolution in x-ray microtomography

TitleEffect of beam hardening on resolution in x-ray microtomography
Publication TypeConference Paper
Year of Publication2004
AuthorsVan de Casteele, E., D. Van Dyck, J. Sijbers, and E. Raman
EditorSonka, M.
Conference NameSPIE Medical Imaging: Image Processing
Volume5370
Pagination2089-2096
Date PublishedFebruary
Conference LocationSan Diego CA, USA
Research area: