Iterative correction of beam hardening artifacts in CT

Publication Type:

Conference Paper

Authors:

Van Slambrouck, Katrien; Gert Van Gompel; M. Defrise; Kees Joost Batenburg; Jan Sijbers; Johan Nuyts

Source:

The First International Conference on Image Formation in X-Ray Computed Tomography (2010)
Research area: 
Tomography