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Luis Filipe Alves Pereira

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Prof. Dr.

Luis Filipe

Alves Pereira

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Key publications:

L. F. Alves Pereira, Janssens, E., Cavalcanti, G. D. C., Tsang, I. R., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Inline Discrete Tomography system: application to agricultural product inspection”, Computers and Electronics in Agriculture, vol. 138, pp. 117–126, 2017.

E. Janssens, Alves Pereira, L. F., De Beenhouwer, J., Tsang, I. R., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Fast inline inspection by neural network based filtered backprojection: Application to apple inspection”, Case Studies in Nondestructive Testing and Evaluation, vol. 6, pp. 14–20, 2016.

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