Fast inline inspection by neural network based filtered backprojection: Application to apple inspection

Publication Type:

Journal Article

Authors:

Eline Janssens; Luis Filipe Alves Pereira; Jan De Beenhouwer; Ing Ren Tsang; Mattias Van Dael; Pieter Verboven; Bart Nicolai; Jan Sijbers

Source:

Case Studies in Nondestructive Testing and Evaluation, Volume 6, p.14–20 (2016)
Files: 
PDF icon Download paper
Research area: 
Tomography