Adapting an XCT-scanner to enable edge illumination X-ray phase contrast imaging

Publication Type:

Conference Paper

Authors:

Ben Huyge; Pieter-Jan Vanthienen; Nathanaël Six; Jan Sijbers; Jan De Beenhouwer

Source:

e-Journal of Nondestructive Testing, Volume 28, Issue 3 (2023)
Research area: 
X-ray imaging