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Adapting an XCT-scanner to enable edge illumination X-ray phase contrast imaging
Publication Type:
Conference Paper
Authors:
Ben Huyge
;
Pieter-Jan Vanthienen
;
Nathanaël Six
;
Jan Sijbers
;
Jan De Beenhouwer
Source:
e-Journal of Nondestructive Testing, Volume 28, Issue 3 (2023)
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Research area:
X-ray imaging