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Analysis of flat fields in edge illumination phase contrast imaging

Publication Type:

Conference Paper

Authors:

Ben Huyge; Jonathan Sanctorum; Nathanaël Six; Jan De Beenhouwer; Jan Sijbers

Source:

2021 IEEE 18th International Symposium on Biomedical Imaging (ISBI), IEEE, Nice, France, p.1310-1313 (2021)

URL:

https://ieeexplore.ieee.org/document/9433849

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