CAD-based defect inspection with optimal view angle selection based on polychromatic X-ray projection images

Publication Type:

Conference Paper

Authors:

Alice Presenti; Jan Sijbers; Arnold Jan den Dekker; Jan De Beenhouwer

Source:

9th Conference on Industrial Computed Tomography, Padova, Italy, p.1-5 (2019)
Files: 
PDF icon ict2019_full_paper_55.pdf