A condensed history approach to x-ray dark field effects in edge illumination phase contrast simulations

Publication Type:

Conference Paper

Authors:

Francken, Nicholas; Jonathan Sanctorum; Jens Renders; Pavel Paramonov; Jan Sijbers; Jan De Beenhouwer

Source:

45th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (2023)
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Research area: 
X-ray imaging