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Deep learning-based 2D/3D registration of an atlas to biplanar X-ray images
Publication Type:
Journal Article
Authors:
Jeroen Van Houtte
;
Emmanuel Audenaert
;
Guoyan Zheng
;
Jan Sijbers
Source:
International Journal of Computer Assisted Radiology and Surgery, Volume 309, p.1333–1342 (2022)
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Research area:
X-ray imaging