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Deep learning based missing wedge artefact removal for electron tomography
Publication Type:
Conference Abstract
Authors:
Juho Rimpelainen
;
Shabab Bazrafkan
;
Jan Sijbers
;
Jan De Beenhouwer
Source:
Microscopy Conference, Berlin, Germany, p.660-661 (2019)
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Research area:
Tomography
Electron Microscopy