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2026
J. Verstraete, Francken, N., Sijbers, J., and De Beenhouwer, J., “Inline Edge Illumination Computed Tomography: A Simulation Study”, in 2026 IEEE 23rd Mediterranean Electrotechnical Conference (MELECON), Cairo, Egypt, 2026.PDF icon Download paper (8.68 MB)
M. Yosifov, Fernandes, T. Linhares, Zanini, F., Carmignato, S., De Beenhouwer, J., Sijbers, J., Kastner, J., and Heinzl, C., “Investigating the Influence of Individual Physical Effects on Dimensional Measurement Deviations Using XCT Simulations”, Measurement, vol. 263, no. 120168, 2026.
J. G. Sanctorum, Bekaert, N., Witteveen, W., Potters, G., Sijbers, J., and De Beenhouwer, J., “Towards X-ray-based inspection of corrosion in maritime infrastructure”, in 15th Conference on Industrial Computed Tomography (iCT), 10 - 13 February 2026, Linz, Austria (iCT 2026) Special Issue of e-Journal of Nondestructive Testing (eJNDT) ISSN 1435-4934 , 2026, vol. 31(3).

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