Methods for characterization and optimisation of measuring performance of stereoscopic x-ray systems with image intensifiers

Publication Type:

Journal Article

Authors:

Joaquim Sanctorum; Dominique Adriaens; Joris J. J. Dirckx; Jan Sijbers; Chris Van Ginneken; Peter Aerts; Sam Van Wassenbergh

Source:

Measurement Science and Technology, Volume 30, Issue 10 (2019)
Research area: 
X-ray imaging