Neural Network Based X-Ray Tomography for Fast Inspection of Apples on a Conveyor Belt

Publication Type:

Conference Paper

Authors:

Eline Janssens; Jan De Beenhouwer; Mattias Van Dael; Pieter Verboven; Bart Nicolai; Jan Sijbers

Source:

IEEE International Conference on Image Processing, p.917-921 (2015)
Research area: 
Tomography