Publications

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2025
F. Linsen, Iuso, D., and Sijbers, J., “Single X-ray Projection Material Decomposition using a Mesh Projector”, in 14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium (iCT 2025), 2025.PDF icon Download paper (857.7 KB)
2024
C. Bossuyt, den Dekker, A. J., Iuso, D., Le Hoang, T., Escoda, J., Costin, M., Sijbers, J., and De Beenhouwer, J., “Deep image prior for sparse-view reconstruction in static, rectangular multi-source x-ray CT systems for cargo scanning”, in SPIE Developments in X-Ray Tomography XV, 2024, vol. 13152.
P. Paramonov, Sanctorum, J. G., Iuso, D., Sijbers, J., and De Beenhouwer, J., “High-resolution tiled X-ray cone-beam CT using the ASTRA toolbox”, in 13th Conference on Industrial Computed Tomography (iCT) 2024, School of Engineering, Wels Campus, Austria, 2024.PDF icon Download paper (532.89 KB)
2022
M. Shahrimie Asaari, Mertens, S., Dhondt, S., Inze, D., and Scheunders, P., “Analysis of Plant Stress Response Using Hyperspectral Imaging and Kernel Ridge Regression”, in 11th International Conference on Robotics, Vision, Signal Processing and Power Applications, Singapore, 2022, vol. 829.
G. Pascoletti, Huysmans, T., Conti, P., and Zanetti, E. M., “Evaluation of a Morphable Anthropomorphic Articulated Total Body Model”, in Design Tools and Methods in Industrial Engineering II - Proceedings of the 2nd International Conference on Design Tools and Methods in Industrial Engineering, ADM 2021, 2022, pp. 761–772.
D. Iuso, Chatterjee, S., Heylen, R., Cornelissen, S., De Beenhouwer, J., and Sijbers, J., “Evaluation of deeply supervised neural networks for 3D pore segmentation in additive manufacturing”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 122421K.PDF icon Download paper (protected) (1.79 MB)
2021
D. Iuso, Nazemi, E., Six, N., De Samber, B., De Beenhouwer, J., and Sijbers, J., “CAD-based scatter compensation for polychromatic reconstruction of additive manufactured parts”, in IEEE ICIP, 2021, pp. 2948-2952.
2006
P. Kempeneers, De Backer, S., Tejada, Z. P. J., Delalieux, S., Canto, S. G., Iribas, M. F., van Aardt, J., Coppin, P., and Scheunders, P., “Stress detection in orchards with hyperspectral remote sensing data”, in SPIE Remote Sensing, Stockholm, Sweden, september 11-14, 2006, vol. 6359.