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D. Iuso, Paramonov, P., De Beenhouwer, J., and Sijbers, J., “Practical multi-mesh registration for few-view poly-chromatic X-ray inspection”, Journal of Non-destructive Testing, vol. 43, 2024.PDF icon Download paper (6.94 MB)
D. Iuso, Chatterjee, S., Cornelissen, S., Verhees, D., De Beenhouwer, J., and Sijbers, J., “Voxel-wise segmentation for porosity investigation of additive manufactured parts with 3D unsupervised and (deeply) supervised neural models”, Applied Intelligence, vol. 54, pp. 13160–13177, 2024.PDF icon Download paper (2.48 MB)
D. Iuso, Paramonov, P., De Beenhouwer, J., and Sijbers, J., “PACS: Projection-driven with Adaptive CADs X-ray Scatter compensation for additive manufacturing inspection”, Precision Engineering, vol. 90, pp. 108-121, 2024.PDF icon Download paper (4.28 MB)