Publications

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Author Type [ Year(Asc)]
Filters: Author is Sandra Van Aert  [Clear All Filters]
2016
J. Fatermans, Van Aert, S., and den Dekker, A. J., “Bayesian model-order selection in electron microscopy to detect atomic columns in noisy images”, RBSM 2016, Brussels, Belgium. p. 53, 2016.
J. Gonnissen, De Backer, A., den Dekker, A. J., Sijbers, J., and Van Aert, S., “Detecting and locating light atoms from high-resolution STEM images: the quest for a single optimal design Ultramicroscopy”, Ultramicroscopy, vol. 170, pp. 128-138, 2016.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Sijbers, J., Van Tendeloo, G., and Bals, S., “Investigating lattice strain in Au nanodecahedrons”, European Microscopy Congress 2016. 2016.
A. De Backer, van den Bos, K. H. W., Van den Broek, W., Sijbers, J., and Van Aert, S., “StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images”, Ultramicroscopy, vol. 171, pp. 104–116, 2016.
2015
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., “Measuring Lattice Strain in Three Dimensions through Electron Microscopy”, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
2014
W. Van den Broek, Rosenauer, A., Sijbers, J., Van Dyck, D., and Van Aert, S., “A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM Ultramicroscopy”, Ultramicroscopy, vol. 141, pp. 22–31, 2014.
J. Gonnissen, De Backer, A., den Dekker, A. J., Martinez, G. T., Rosenauer, A., Sijbers, J., and Van Aert, S., “Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images”, Applied Physics Letters, vol. 105, no. 063116, 2014.
2013
A. J. den Dekker, Gonnissen, J., De Backer, A., Sijbers, J., and Van Aert, S., “Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?”, Ultramicroscopy, vol. 134, pp. 34-43, 2013.
2011
K. J. Batenburg, Bals, S., Van Aert, S., Roelandts, T., and Sijbers, J., “Ultra-High Resolution Electron Tomography for Materials Science: A Roadmap”, Microscopy and Microanalysis 2011 Meeting. Nashville, TN, United States, 2011.

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