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2010
G. Perfetti, Van de Casteele, E., Rieger, B., Wildeboer, W. J., and Meesters, G. M. H., “X-ray micro tomography and image analysis as complementary methods for morphological characterization and coating thickness measurement of coated particles”, Advanced Powder Technology, vol. 21, no. 6, pp. 663 - 675, 2010.