Publications

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Filters: Author is Van Tendeloo, Gustaaf  [Clear All Filters]
2016
S. Van Aert, De Backer, A., Martinez, G. T., den Dekker, A. J., Van Dyck, D., Bals, S., and Van Tendeloo, G., “Advanced electron crystallography through model-based imaging”, IUCrJ, vol. 3, 2016.
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Sijbers, J., Van Tendeloo, G., and Bals, S., “Investigating lattice strain in Au nanodecahedrons”, European Microscopy Congress 2016. 2016.
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., de Nijs, B., van Huis, M. A., Sánchez-Iglesias, A., Liz-Marzán, L. M., van Blaaderen, A., Batenburg, K. J., Bals, S., and Van Tendeloo, G., “Quantitative 3D analysis of huge nanoparticle assemblies.”, Nanoscale, vol. 8, no. 1, pp. 292-9, 2016.
2015
B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., “Measuring Lattice Strain in Three Dimensions through Electron Microscopy”, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.
D. Zanaga, Bleichrodt, F., Altantzis, T., Winckelmans, N., Palenstijn, W. J., Sijbers, J., van Nijs, B., van Huis, M. A., van Blaaderen, A., Sánchez-Iglesias, A., Liz-Marzán, L. M., Batenburg, K. J., Bals, S., and Van Tendeloo, G., “Quantitative 3D analysis of huge nanoparticle assemblies”, Nanoscale, vol. 8, no. 1, pp. 292-299, 2015.
2009
K. J. Batenburg, Bals, S., Sijbers, J., Kubel, C., Midgley, P. A., Hernandez, J. C., Kaiser, U., Encina, E. R., Coronado, E. A., and Van Tendeloo, G., “3D imaging of nanomaterials by discrete tomography”, Ultramicroscopy, vol. 109, pp. 730-740, 2009.
2007
S. Bals, Batenburg, K. J., Verbeeck, J., Sijbers, J., and Van Tendeloo, G., “Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes”, Nano Letters, vol. 7, pp. 3669-3674, 2007.