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2020
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., “3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM”, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.