Publications

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2020
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Gauquelin, N., Verbeeck, J., and Van Aert, S., “Atom column detection from simultaneously acquired ABF and ADF STEM images”, Ultramicroscopy, vol. 219, p. 113046, 2020.
2018
J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Lobato, I., O'Leary, C. M., Nellist, P. D., and Van Aert, S., “Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images”, Phys. Rev. Lett., vol. 121, p. 056101, 2018.