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D. Iuso, Chatterjee, S., Heylen, R., Cornelissen, S., De Beenhouwer, J., and Sijbers, J., “Evaluation of deeply supervised neural networks for 3D pore segmentation in additive manufacturing”, in SPIE Optical Engineering: Developments in X-Ray Tomography XIV , 2022, vol. 12242, p. 122421K.PDF icon Download paper (protected) (1.79 MB)
D. Iuso, Nazemi, E., Six, N., De Samber, B., De Beenhouwer, J., and Sijbers, J., “CAD-based scatter compensation for polychromatic reconstruction of additive manufactured parts”, in IEEE ICIP, 2021.