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S. Van Aert, De Backer, A., Martinez, G. T., den Dekker, A. J., Van Dyck, D., Bals, S., and Van Tendeloo, G., Advanced electron crystallography through model-based imaging, IUCrJ, vol. 3, 2016.
S. Van Aert, Fatermans, J., De Backer, A., van den Bos, K. H. W., O'Leary, C. M., Müller-Caspary, K., Jones, L., Lobato, I., Béché, A., den Dekker, A. J., Bals, S., and Nellist, P. D., Maximising dose efficiency in quantitative STEM to reveal the 3D atomic structure of nanomaterials, IMC19, Sydney, Australia. 2018.
S. Van Aert, De wael, A., Fatermans, J., Lobato, I., De Backer, A., Jones, L., den Dekker, A. J., and Nellist, P. D., Strategies for quantifying 3D atomic structures of nanomaterials and their dynamics using dose-efficient ADF STEM, PICO2019, Vaalsbroek, The Netherlands. 2019.
S. Van Aert, De wael, A., Fatermans, J., Lobato, I., De Backer, A., Jones, L., den Dekker, A. J., and Nellist, P. D., Quantifying 3D atomic structures of nanomaterials and their dynamics using model-based scanning transmission electron microscopy, Spring Meeting of the EMRS, Nice, France. 2019.
S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., 3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.