Log in

Electron Microscopy

Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM

S. Van Aert, De Backer, A., De wael, A., Fatermans, J., E Irmak, A., Friedrich, T., Lobato, I., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., “Strategies for quantifying the 3D atomic structure and the dynamics of nanomaterials using model-based STEM”, Virtual MRS Spring/ Fall Meeting, Boston, United States (online). 2020.

Bayesian model selection for atom column detection from ABF-ADF STEM images

J. Fatermans, den Dekker, A. J., Gauquelin, N., Verbeeck, J., and Van Aert, S., “Bayesian model selection for atom column detection from ABF-ADF STEM images”, Virtual Early Career EMC 2020 (online), Copenhagen, Denmark. 2020.

3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM

S. Van Aert, De Backer, A., De wael, A., Fatermans, J., Friedrich, T., Lobato, I., O'Leary, C. M., Varambhia, A., Altantzis, T., Jones, L., den Dekker, A. J., Nellist, P. D., and Bals, S., “3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM”, Microscopy & Microanalysis 2020 (online), Milwaukee, United States. 2020.

Atom column detection from simultaneously acquired ABF and ADF STEM images

J. Fatermans, den Dekker, A. J., Müller-Caspary, K., Gauquelin, N., Verbeeck, J., and Van Aert, S., “Atom column detection from simultaneously acquired ABF and ADF STEM images”, Ultramicroscopy, vol. 219, p. 113046, 2020.

A Trajectory Based Bottom-Up Volume Reconstruction Method for Atom Probe Tomography

Y. - T. Ling, Cools, S., De Beenhouwer, J., Sijbers, J., and Vandervorst, W., “A Trajectory Based Bottom-Up Volume Reconstruction Method for Atom Probe Tomography”, European Atom Probe Workshop. 2019.

Quantitative atom detection from atomic-resolution transmission electron microscopy images

J. Fatermans, “Quantitative atom detection from atomic-resolution transmission electron microscopy images”, 2019.

Files:

Download thesis

Atom detection from electron microscopy images

J. Fatermans, den Dekker, A. J., and Van Aert, S., “Atom detection from electron microscopy images”, RBSM 2019, Louvain-la-Neuve, Belgium. p. 15, 2019.

Atom column detection from STEM images using the maximum a posteriori probability rule

J. Fatermans, den Dekker, A. J., O'Leary, C. M., Nellist, P. D., and Van Aert, S., “Atom column detection from STEM images using the maximum a posteriori probability rule”, MC 2019, Berlin, Germany. 2019.

Deep learning based missing wedge artefact removal for electron tomography

J. Rimpelainen, Bazrafkan, S., Sijbers, J., and De Beenhouwer, J., “Deep learning based missing wedge artefact removal for electron tomography”, Microscopy Conference, Berlin, Germany. pp. 660-661, 2019.

Pages