Inline Edge Illumination Computed Tomography: A Simulation Study

Publication Type:

Conference Paper

Authors:

Verstraete, J.; Francken, N.; Jan Sijbers; Jan De Beenhouwer

Source:

2026 IEEE 23rd Mediterranean Electrotechnical Conference (MELECON), Cairo, Egypt (2026)

Keywords:

edge illumination, Industry 4.0, Inline inspection, Non-destructive testing, X-ray phase contrast computed tomography
Files: 
PDF icon ieee_melecon_2026-2.pdf
Research area: 
X-ray imaging