Elke Van de Casteele

Personal

Biography: 

Elke Van de Casteele graduated in physics at the University of Antwerp in 1998. She received a PhD in 2004 for the work entitled “Model-based approach for Beam Hardening Correction and Resolution measurements in Microtomography”, which was carried out at the Vision Lab. Before her actual PhD-defense she started working at SkyScan, an SME specialized in the development and manufacturing of X-ray micro- and nano-CT systems. In 2010 she returned to the university as a post-doctoral researcher.

Research

My main passion and interest is X-ray micro-tomography with its different applications and challenges in imaging and image analysis.

Key publications: 

E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., “A model-based correction method for beam hardening artefacts in X-ray microtomography”, Journal of X-ray science and technology, vol. 12, pp. 53-57, 2004.

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E. Van de Casteele, Van Dyck, D., Sijbers, J., and Raman, E., “An energy-based beam hardening model in tomography”, Physics in Medicine and Biology, vol. 47, pp. 4181-4190, 2002.

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