Jan De Beenhouwer

Research

Key publications: 

V. Van Nieuwenhove, De Beenhouwer, J., De Schryver, T., Van Hoorebeke, L., and Sijbers, J., “Data-Driven Affine Deformation Estimation and Correction in Cone Beam Computed Tomography”, IEEE Transactions on Image Processing, vol. 26, no. 3, pp. 1441-1451, 2017.

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V. Van Nieuwenhove, Van Eyndhoven, G., Batenburg, K. J., Buls, N., Vandemeulebroucke, J., De Beenhouwer, J., and Sijbers, J., “Local Attenuation Curve Optimization (LACO) framework for high quality perfusion maps in low-dose cerebral perfusion CT”, Medical Physics, vol. 43, no. 12, pp. 6429-6438, 2016.

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E. Janssens, Alves Pereira, L. F., De Beenhouwer, J., Tsang, I. R., Van Dael, M., Verboven, P., Nicolai, B., and Sijbers, J., “Fast inline inspection by neural network based filtered backprojection: Application to apple inspection”, Case Studies in Nondestructive Testing and Evaluation, vol. 6, pp. 14–20, 2016.

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Download paper (726.63 KB)

V. Van Nieuwenhove, De Beenhouwer, J., De Carlo, F., Mancini, L., Marone, F., and Sijbers, J., “Dynamic intensity normalization using eigen flat fields in X-ray imaging”, Optics Express, vol. 23, no. 21, pp. 27975-27989, 2015.

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Download Matlab code (2.92 MB) Download paper (1.68 MB)

B. Goris, De Beenhouwer, J., De Backer, A., Zanaga, D., Batenburg, K. J., Sánchez-Iglesias, A., Liz-Marzán, L. M., Van Aert, S., Bals, S., Sijbers, J., and Van Tendeloo, G., “Measuring Lattice Strain in Three Dimensions through Electron Microscopy”, Nano Letters, vol. 15, no. 10, pp. 6996–7001, 2015.

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