Data-Driven Affine Deformation Estimation and Correction in Cone Beam Computed Tomography

Publication Type:

Journal Article

Authors:

Vincent Van Nieuwenhove; Jan De Beenhouwer; Thomas De Schryver; Luc Van Hoorebeke; Jan Sijbers

Source:

IEEE Transactions on Image Processing, Volume 26, Issue 3, p.1441-1451 (2017)
Research area: 
X-ray imaging
Tomography