3D total variation denoising in X-CT imaging applied to pore extraction in additively manufactured parts

Publication Type:

Journal Article

Authors:

Rob Heylen; Aditi Thanki; Dries Verhees; Domenico Iuso; Jan De Beenhouwer; Jan Sijbers; Ann Witvrouw; Han Haitjema; Abdellatif Bey-Temsamani

Source:

Measurement Science and Technology, Volume 33, Issue 4, p.1-12 (2022)
Research area: 
X-ray imaging
Tomography