Alternative grating designs for cone-beam edge illumination X-ray phase contrast imaging

Publication Type:

Conference Paper

Authors:

Pieter-Jan Vanthienen; Jonathan Sanctorum; Ben Huyge; Nathanaël Six; Jan Sijbers; Jan De Beenhouwer

Source:

Proc. SPIE 12242, Developments in X-Ray Tomography XIV, SPIE, Volume 12242, San Diego, USA, p.122420Z (2022)
Research area: 
X-ray imaging
Tomography