Augmenting a conventional X-ray scanner with edge illumination based phase contrast imaging: how to design the gratings?

Publication Type:

Conference Paper

Authors:

Jonathan Sanctorum; Nathanaël Six; Jan Sijbers; Jan De Beenhouwer

Source:

Proc. SPIE 12242, Developments in X-Ray Tomography XIV, SPIE, San Diego, USA, p.1224218 (2022)
Research area: 
X-ray imaging
Tomography