Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography

Publication Type:

Journal Article

Authors:

Mattias Van Dael; Pieter Verboven; Angelo Zanella; Jan Sijbers; Bart Nicolai

Source:

Postharvest Biology and Technology, Volume 148, p.218-227 (2019)
Research area: 
X-ray imaging
Tomography