Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography

TitleCombination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography
Publication TypeJournal Article
Year of Publication2018
AuthorsM. Van Dael, P. Verboven, A. Zanella, J. Sijbers, and B. Nicolai
JournalPostharvest Biology and Technology
DOI10.1016/j.postharvbio.2018.05.020
Research area: