Comparison of methods for online inspection of apple internal quality

Publication Type:

Conference Paper

Authors:

Mattias Van Dael; Pieter Verboven; Luc Van Hoorebeke; Jan Sijbers; Bart Nicolai

Source:

7th Conference on Industrial Computed Tomography, Leuven, Belgium (2017)

URL:

http://www.ndt.net/events/iCT2017/app/content/Extended_Abstract/35_VanDael.pdf
Files: 
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Research area: 
X-ray imaging
Tomography