Correcting for focal spot drift in edge illumination X-ray phase contrast imaging

Publication Type:

Conference Paper

Authors:

Francken, Nicholas; Jonathan Sanctorum; Ben Huyge; Jan Sijbers; Jan De Beenhouwer

Source:

14th Conference on Industrial Computed Tomography (iCT), 4 - 7 February 2025, Antwerp, Belgium (2025)
Research area: 
X-ray imaging