Dynamic flat field correction in edge illumination imaging

Publication Type:

Conference Paper

Authors:

Didem Gökbel Keklikoğlu; Francken, Nicholas; Ben Huyge; Ziya Merdan; Jan De Beenhouwer; Jan Sijbers

Source:

SPIE Developments in X-Ray Tomography XV, Volume 13152 (2024)
Research area: 
X-ray imaging
Tomography